IEM10+: BENCHTOP SCANNING ELECTRON MICROSCOPE
SEMoscope IEM 10+ Benchtop SEM: is an advanced version of the model IEM 10 Scanning Electron Microscope , it has SE and EDS detectors. It is a useful analytical tool in many areas, from materials science and nanotechnology, to biology and microelectronics.
Specifications
- Magnifcation Up To x 100,000
- Auto Stage : X, Y, T Axis
- Click & Move Stage Control
- Auto Function : Filament Memory, Focus, Contrast, Brightness
- High Defnition Image : 5120 X 3840 Pixel
- Thermo EDS Detector: 133 eV at Mn, B(5) ~ U(92)
| Magnifcation | x20 ~ x100,000 (Efficient: ~x50,000) |
| Acc Voltage | 1 ~ 30 kV (1kV increments) |
| Electron Gun | Tungsten Filament (W) |
| Detector | SE and EDS Detectors |
| Stage | Auto Stage (X: 35mm,Y: 35mm,T: 0 to 45o )
Manual Stage (Z: 5 to 50mm) |
| Image Shift | :X, Y, R(Rotation) |
| Operating System | Microsoft Windows 7 |
| Dimensions | 400(W) x 600(L) x 550(H) mm |
| Weight | 85Kg |
